Available diffraction techniques

• High Pressure powder XRD with DAC
  
• Resonance X-ray Diffraction and polarization analysis
• Grazing incidence X-ray diffraction (GIXRD) and anomalous-GIXRD
• Grazing incidence small angle X-ray scattering (GISAXS) and anomalous-GISAXS
• General diffraction with psi diffractometer
• Diffraction  Anomalous  Near  Edge Structure (DANES)

 USER GUIDE

Flux

Flux at psi-8 diffractometer

Flux under GISAXS setup

XRD Publications (Google scholar citations)

 Applications

• Structure of materials in high pressure
• Characterization of magnetic structure from bulk and thin film samples
• Thin film structure characterization
• In situ structure characterization with controlled sample environment
• Operando reaction study with flow-cell furnace

Available Equipments

• Huber psi-8 diffractometer
• ARS closed cycle cryostat (10 - 450 K)
• In-situ  furnace/flow reaction cell (RT - 1175 K)
• GISAXS mini-chamber for controlled sample environments (gas pressure and temperature control)
• X-ray CCD detector (Rayonix SX165)
• Analyser crystals ( HOPG(100), Au(111), Cu(100), Cu(110), Cu(111), Al(110), Al(111), Ge(111), Si(111), and Si(100) )
• Cyberstar Scintillation detector