HXMA XRD
Available diffraction techniques
- High Pressure powder XRD with DAC
- Resonance X-ray Diffraction and polarization analysis
- Grazing incidence X-ray diffraction (GIXRD) and anomalous-GIXRD
- Grazing incidence small angle X-ray scattering (GISAXS) and anomalous-GISAXS
- General diffraction with psi diffractometer
- Diffraction Anomalous Near Edge Structure (DANES)
USER GUIDE
Flux
XRD Publications (Google scholar citations)
Applications
- Structure of materials in high pressure
- Characterization of magnetic structure from bulk and thin film samples
- Thin film structure characterization
- In situ structure characterization with controlled sample environment
- Operando reaction study with flow-cell furnace
Available Equipments
- Huber psi-8 diffractometer
- ARS closed cycle cryostat (10 - 450 K)
- In-situ furnace/flow reaction cell (RT - 1175 K)
- GISAXS mini-chamber for controlled sample environments (gas pressure and temperature control)
- X-ray CCD detector (Rayonix SX165)
- Analyser crystals ( HOPG(100), Au(111), Cu(100), Cu(110), Cu(111), Al(110), Al(111), Ge(111), Si(111), and Si(100) )
- Cyberstar Scintillation detector